Introduction. - Statistics. - Yield Statistics. - Area Dependence of the Yield. - Statistics of Embedded Object Fails. - Fail Commonalities. - Spatial Patterns. - Test Coverage and Test Fallout. - Logic Diagnosis. - Slat Based Diagnosis. - Data Collection Requirements. - Appendix A. Distribution of IC Fails. - Appendix B. General Yield Model. - Appendix C. Simplified Center-Satellite Model. - Appendix D. Quadrat Analysis. - Appendix E. Cell Fail Probabilities. - Appendix F. Characterization Group. - Appendix G. Component Fail Probabilities. - Appendix H. Yield and Coverage. - Appendix I. Estimating First Fail Probabilities from the Fallout. - Appendix J. Identity of M and S. - References. - Index. . Language: English