For electronic engineers, manufacturers, and professionals who need a reliable solution for testing and programming semiconductor devices. Stable performance with TO3P TO247 5L aging test sockets featuring gold plating, delivering corrosion-resistant, repeatable electrical contacts during burn-in and aging. Easy-to-use TO3P TO247 5L sockets that integrate quickly into test benches, helping extend device life and lab throughput. Robust design for mass production lines or electronics centers, optimized for testing and screening TO3P and TO247 5L components. Benefits at a glance: reliable contact, broad compatibility with TO3P/TO247 5L, durable for repeated cycles, simple setup. Applications: - Prototyping and development benches testing TO3P/TO247 power devices. - Production burn-in and screening on assembly lines. - Post-repair testing in service centers to verify reliability.