- Designed for mass production lines and electronic device repair centers, this aging test and burn-in socket efficiently tests TO3P and TO247-5L components. - Capable of withstanding high temperatures and rated for a current capacity of 10 A, this socket is ideal for low-power devices. - Enhance the longevity and functionality of your electronic devices with user-friendly TO3P and TO247-5L aging test sockets, an essential tool for any electronics development laboratory. - Experience stable performance with the TO3P and TO247-5L aging test sockets, featuring gold plating to provide excellent oxidation resistance for electronic components. Use Scenarios: 1. Utilize this socket in production environments to streamline the testing process for TO3P and TO247-5L components, ensuring quality and reliability before deployment. 2. Implement the aging test socket in repair centers to accurately diagnose and assess the performance of electronic devices, improving repair turnaround times. 3. Integrate it into your electronics development lab to facilitate rigorous testing and validation of new designs, enhancing product reliability and market readiness.