IDDQ Testing of VLSI Circuits

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IDDQ Testing of VLSI Circuits

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IDDQ Testing of VLSI Circuits

  • 品牌: Unbranded
价格： $209.00
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IDDQ Testing of VLSI Circuits

IDDQ Testing: A Review. - Iddq Testing as a Component of a Test Suite: The Need for Several Fault Coverage Metrics. - Iddq Testing in CMOS Digital ASICs. - Reliability Benefits of IDDQ. - Quiescent Current Analysis and Experimentation of Defective CMOS Circuits. - QUIETEST: A Methodology for Selecting IDDQ Test Vectors. - Generation and Evaluation of Current and Logic Tests for Switch-Level Sequential Circuits. - Diagnosis of Leakage Faults with IDDQ. - Algorithms for IDDQ Measurement Based Diagnosis of Bridging Faults. - Proportional BIC Sensor for Current Testing. - Design of ICs Applying Built-in Current Testing. Language: English
  • 品牌: Unbranded
  • 类别: 计算机与互联网
  • 语言: English
  • 出版日期: 2012/10/12
  • 艺术家: Ravi K. Gulati
  • 页数: 124
  • 出版社／标签: Springer
  • 格式: Paperback
  • Fruugo ID: 340631037-747129304
  • ISBN: 9781461363774

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