- Compact Design for Accessibility: This magnetic field probe is engineered for near field detection, allowing seamless use in tight spaces. It's ideal for precise electromagnetic compatibility (EMC) measurements on printed circuit boards and compact electronic devices. - Exceptional Sensitivity for Accurate Data: With its high sensitivity, this probe effectively detects changes in electromagnetic fields, providing accurate data to help you quickly identify and resolve interference issues. - Versatile Compatibility: The probe is designed for easy integration with various test equipment, making it suitable for electronics manufacturing, research and development projects, and quality control processes. - Durable Construction for Reliability: Crafted from robust materials, this E-field probe is built to endure challenging testing environments while ensuring consistent performance over time. Use Scenarios: 1. In electronics manufacturing, utilize the probe to identify electromagnetic interference during production, ensuring product reliability and compliance. 2. In R&D, integrate the probe into your testing setups to analyze electromagnetic field behavior in new designs, leading to improved product performance. 3. During quality control, deploy the probe to verify the electromagnetic compatibility of finished products, ensuring they meet industry standards before reaching the market.