Testing Static Random Access Memories

$199.00
+ $11.99 送货

Testing Static Random Access Memories

由……售出:

$199.00

有货
+ $11.99 送货

14天退货政策

付款方式:

  • 品牌: Unbranded

描述

Testing Static Random Access Memories

I Introductory. - 1 Introduction. - 2 Semiconductor memory architecture. - 3 Space of memory faults. - 4 Preparation for circuit simulation. - II Testing single-port and two-port SRAMs. - 5 Experimental analysis of two-port SRAMs. - 6 Tests for single-port and two-port SRAMs. - 7 Testing restricted two-port SRAMs. - III Testing p-port SRAMs. - 8 Experimental analysis of p-port SRAMs. - 9 Tests for p-port SRAMs. - 10 Testing restricted p-port SRAMs. - 11 Trends in embedded memory testing. - A Simulation results for two-port SRAMs. - A. 1 Simulation results for opens. - A. 2 Simulation results for shorts. - A. 3 Simulation results for bridges. - B Simulation results for three-port SRAMs. - B. 1 Simulation results for opens and shorts. - B. 2 Simulation results for bridges. Language: English
  • 品牌: Unbranded
  • 类别: 教育
  • 语言: English
  • 出版日期: 2010/12/09
  • 艺术家: Said Hamdioui
  • 页数: 221
  • 出版社/标签: Springer
  • 格式: Paperback
  • Fruugo ID: 337835302-741493925
  • ISBN: 9781441954305

送货

在 4 天内发货

  • STANDARD: $11.99 - 之间的交付 周一 31 八月 2026–周四 03 九月 2026

从 英国 送货。

退货

我们会争取将您订购的产品按照您的规格完整地配送给您。不过,万一您收到不完整的订单,或收到的产品与您订购的不同,或者有其他原因让您对订单不满意,您可以要求全部或部分退货,您将收到相应产品的全额退款。

查看完整的退货政策