- Reliable Performance: Designed with TO3P TO247 5L aging test sockets that feature gold plating, ensuring excellent oxidation resistance for electronic components. - High Temperature and Current Capacity: This socket withstands high temperatures and supports a current carrying capacity of 10 A, making it ideal for low-power devices. - Perfect for Professionals: Tailored for electronic engineers, manufacturers, and professionals seeking a dependable solution for testing and programming semiconductor devices. - Efficient Testing Solution: Whether used in mass production lines or electronic device repair centers, this aging test and burn-in socket is optimized for effective testing and screening of TO3P and TO247-5L components. - Versatile Applications: Suitable for various scenarios such as prototype development, quality assurance in manufacturing, and troubleshooting in repair environments, ensuring reliability across multiple uses. - Durable Construction: Built with high-quality materials to enhance longevity and performance, ensuring consistent results in all testing conditions.