TO3P and TO247-5L aging test sockets, gold-plated for strong oxidation resistance in electronic components. Stable performance at elevated temperatures with a 10 A current rating, suitable for low-power devices. - Clear, reliable test and programming tool for electronics engineers, manufacturers, and professionals. - Designed for high-temperature operation and robust contact reliability during burn-in and screening. - Compatible with TO3P and TO247-5L packages; suitable for compact test setups and production environments. - Ideal for mass production lines and repair centers to efficiently test and screen semiconductor devices. Key attributes - Function: burn-in, aging testing, and device screening. - Compatibility: TO3P and TO247-5L components. - Material: gold-plated contacts for excellent oxidation resistance. - Performance: stable, high-temperature operation with 10 A current carrying capability. - Size/form factor: compact burn-in socket suitable for factory and lab use. Use scenarios - High-volume burn-in testing on a production line to identify early-life failures in TO3P/TO247-5L ICs. - R&D lab environment for reliable testing and programming of prototype semiconductor devices. - Repair or service centers for rapid screening of components removed from devices during servicing.