TO3P TO247 5L aging test sockets, gold plated for strong oxidation resistance in electronic components. - Compatibility and function: designed for TO3P and TO247 5L packages, serving as an aging test and burn-in socket for efficient testing and verification of these components. - Performance and materials: gold-plated contacts to enhance oxidation resistance; engineered to withstand high temperatures with a current rating of 10 A; suitable for devices with low power requirements. - Intended users: electronics engineers, manufacturers, and professionals looking for a reliable solution to test and program semiconductor devices. - Use scenarios: 1) In mass production lines, perform burn-in testing and quick verification of TO3P and TO247 5L components to ensure reliability before assembly. 2) In repair centers, validate refurbished devices and components during diagnostic testing and rework. 3) In R&D labs, test and program semiconductor devices during development to confirm performance under burn-in conditions.